Each Test Image Deserves A Specific Prompt: Continual Test-Time Adaptation for 2D Medical Image Segmentation

Ziyang Chen, Yongsheng Pan, Yiwen Ye, Mengkang Lu, Yong Xia

Research output: Contribution to journalConference articlepeer-review

10 Scopus citations

Abstract

Distribution shift widely exists in medical images acquired from different medical centres and poses a significant obstacle to deploying the pretrained semantic segmentation model in real-world applications. Test-time adaptation has proven its effectiveness in tackling the cross-domain distribution shift during inference. However, most existing methods achieve adaptation by updating the pretrained models, rendering them susceptible to error accumulation and catastrophic forgetting when encountering a series of distribution shifts (i.e., under the continual test-time adaptation setup). To overcome these challenges caused by updating the models, in this paper, we freeze the pretrained model and propose the Visual Prompt-based Test-Time Adaptation (VPTTA) method to train a specific prompt for each test image to align the statistics in the batch normalization layers. Specifically, we present the low-frequency prompt, which is lightweight with only a few parameters and can be effectively trained in a single iteration. To enhance prompt initialization, we equip VPTTA with a memory bank to benefit the current prompt from previous ones. Additionally, we design a warm-up mechanism, which mixes source and target statistics to construct warm-up statistics, thereby facilitating the training process. Extensive experiments demonstrate the superiority of our VPTTA over other state-of-the-art methods on two medical image segmentation benchmark tasks. The code and weights of pretrained source models are available at https://github.com/Chen-Ziyang/VPTTA.

Original languageEnglish
Pages (from-to)11184-11193
Number of pages10
JournalProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
DOIs
StatePublished - 2024
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

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