Dual wavelength digital holography for improving the measurement accuracy

Jianglei Di, Weijuan Qu, Bingjing Wu, Xin Chen, Jianlin Zhao, Anand Asundi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

In dual wavelength digital holography, a synthetic wavelength is obtained by using two lasers with different wavelengths to expand the measurement range of samples' step heights from nanometers to micrometers. However, its measurement accuracy reduces along with the expansion of measuring range and significant noise is introduced at the same time. For cases where the sample's height is smaller than the wavelength of illumination light, the measurement accuracy is very important. In this paper, a new approach of dual wavelength digital holography is presented. The synthetic wavelength is smaller than the wavelength of the two different lasers. Higher measurement accuracy can thus be achieved. The analysis and experimental results show the validity of this method.

Original languageEnglish
Title of host publicationInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
DOIs
StatePublished - 2013
EventInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013 - Singapore, Singapore
Duration: 9 Apr 201311 Apr 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8769
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
Country/TerritorySingapore
CitySingapore
Period9/04/1311/04/13

Keywords

  • Digital holography
  • Dual wavelength
  • Measurement accuracy
  • Numerical reconstruction

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