Abstract
The effect of LiF buffer layer on hole-injection in indium-tin oxide (ITO)\N,N′-bis(1-naphthyl)-N,Ǹ -diphenyl-1,1′ biphenyl 4,4′ -diamine (NPB)-based organic light-emitting diodes (OLED) was discussed. It was found that hole-injection in ITO\NPB-based OLEDs depended upon the initial barrier height (IBH) at ITO\NPB interfaces. It was observed that LiF buffer enchanced the hole injection when the IBH was large but it weakened the hole injection when the IBH was small. Analysis shows that the variation of current injection induced by the insulating buffers in OLEDs was the result of energy realignment and the change in carrier tunneling probability.
Original language | English |
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Pages (from-to) | 2913-2915 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 15 |
DOIs | |
State | Published - 12 Apr 2004 |
Externally published | Yes |