Double response surface method of reliability analysis for mechanism

C. Y. Zhang, J. Y. Liu, C. Lu, B. S. Liu, A. H. Wang, M. Y. Bai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A new method for analyzing the reliability of mechanism is proposed. The proposed method suggests the use of two response surface functions to evaluate the reliability probability. Structural reliability can be calculated through the analysis of the maximum stress and the maximum deformation of crank-rocker mechanism to establish its limit states equations respectively and then ganged sample these response surfaces that is double response surface, structural reliability can be calculated. Aiming at analyzing reliability of mechanical system with multiple components which have multiple failure modes, this method can realize the whole reliability analysis under the consideration of the correlation of these failure modes. The example result indicates that calculation velocity of this method is high; precision of this method is exact. It can be used in other researches and projects.

Original languageEnglish
Title of host publicationIEEM 2015 - 2015 IEEE International Conference on Industrial Engineering and Engineering Management
PublisherIEEE Computer Society
Pages991-995
Number of pages5
ISBN (Electronic)9781467380669
DOIs
StatePublished - 18 Jan 2016
Externally publishedYes
EventIEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015 - Singapore, Singapore
Duration: 6 Dec 20159 Dec 2015

Publication series

NameIEEE International Conference on Industrial Engineering and Engineering Management
Volume2016-January
ISSN (Print)2157-3611
ISSN (Electronic)2157-362X

Conference

ConferenceIEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015
Country/TerritorySingapore
CitySingapore
Period6/12/159/12/15

Keywords

  • crank-rocker mechanism
  • double response surface
  • failure mode
  • ganged sample
  • reliability

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