Design and implementation of a test system for a new QDUC

Shouguo Yang; Kunhui Zhang; Yong Li; Weiping Tang; Xiang Gao

doi:10.1109/ICEMI.2011.6037866

Design and implementation of a test system for a new QDUC

Shouguo Yang, Kunhui Zhang, Yong Li, Weiping Tang, Xiang Gao

School of Electronics and Information

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.

Original language	English
Title of host publication	Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Pages	109-112
Number of pages	4
DOIs	https://doi.org/10.1109/ICEMI.2011.6037866
State	Published - 2011
Event	IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 - Chengdu, China Duration: 16 Aug 2011 → 18 Aug 2011

Publication series

Name	Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Volume	3

Conference

Conference	IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Country/Territory	China
City	Chengdu
Period	16/08/11 → 18/08/11

Keywords

AD9957
CPLD
MCU
QUDC
test system

Access to Document

10.1109/ICEMI.2011.6037866

Cite this

Yang, S., Zhang, K., Li, Y., Tang, W., & Gao, X. (2011). Design and implementation of a test system for a new QDUC. In Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 (pp. 109-112). Article 6037866 (Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011; Vol. 3). https://doi.org/10.1109/ICEMI.2011.6037866

@inproceedings{267f41e4aa76418799866b74dcb3287a,

title = "Design and implementation of a test system for a new QDUC",

abstract = "With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.",

keywords = "AD9957, CPLD, MCU, QUDC, test system",

author = "Shouguo Yang and Kunhui Zhang and Yong Li and Weiping Tang and Xiang Gao",

year = "2011",

doi = "10.1109/ICEMI.2011.6037866",

language = "英语",

isbn = "9781424481590",

series = "Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011",

pages = "109--112",

booktitle = "Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011",

note = "IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 ; Conference date: 16-08-2011 Through 18-08-2011",

}

Yang, S, Zhang, K, Li, Y, Tang, W & Gao, X 2011, Design and implementation of a test system for a new QDUC. in Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011., 6037866, Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011, vol. 3, pp. 109-112, IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011, Chengdu, China, 16/08/11. https://doi.org/10.1109/ICEMI.2011.6037866

Design and implementation of a test system for a new QDUC. / Yang, Shouguo; Zhang, Kunhui; Li, Yong et al.
Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011. 2011. p. 109-112 6037866 (Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011; Vol. 3).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Design and implementation of a test system for a new QDUC

AU - Yang, Shouguo

AU - Zhang, Kunhui

AU - Li, Yong

AU - Tang, Weiping

AU - Gao, Xiang

PY - 2011

Y1 - 2011

N2 - With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.

AB - With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.

KW - AD9957

KW - CPLD

KW - MCU

KW - QUDC

KW - test system

UR - http://www.scopus.com/inward/record.url?scp=80054909480&partnerID=8YFLogxK

U2 - 10.1109/ICEMI.2011.6037866

DO - 10.1109/ICEMI.2011.6037866

M3 - 会议稿件

AN - SCOPUS:80054909480

SN - 9781424481590

T3 - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

SP - 109

EP - 112

BT - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

T2 - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

Y2 - 16 August 2011 through 18 August 2011

ER -

Yang S, Zhang K, Li Y, Tang W, Gao X. Design and implementation of a test system for a new QDUC. In Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011. 2011. p. 109-112. 6037866. (Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011). doi: 10.1109/ICEMI.2011.6037866

Design and implementation of a test system for a new QDUC

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this