Design and implementation of a test system for a new QDUC

Shouguo Yang, Kunhui Zhang, Yong Li, Weiping Tang, Xiang Gao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.

Original languageEnglish
Title of host publicationProceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Pages109-112
Number of pages4
DOIs
StatePublished - 2011
EventIEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 - Chengdu, China
Duration: 16 Aug 201118 Aug 2011

Publication series

NameProceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Volume3

Conference

ConferenceIEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Country/TerritoryChina
CityChengdu
Period16/08/1118/08/11

Keywords

  • AD9957
  • CPLD
  • MCU
  • QUDC
  • test system

Fingerprint

Dive into the research topics of 'Design and implementation of a test system for a new QDUC'. Together they form a unique fingerprint.

Cite this