Deformation and annealing textures of Ti-45Nb wires

Yi Chen, Bin Tang, Min Jie Lai, Guo Qiang Shang, Hong Chao Kou, Feng Shou Zhang, Zhi Shou Zhu, Lian Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, we investigate the microstructure and texture evolution during the drawing and recrystallization process in the Ti-45Nb wires. The deformation modes affected on the microstructure and texture evolution is characterized. The results show that the 〈110〉 fiber texture is the mainly texture component of the cold-drawn and warm-drawn Ti-45Nb wires. After annealing,the main texture components of the warm drawn Ti-45Nb wires are remain the same and the strength of the texture components is reduced. However, the new recrystallization texture components (114) 〈110〉 and (112) 〈110〉 are found in the cold drawn Ti-45Nb wires after annealing.

Original languageEnglish
Title of host publicationTi 2011 - Proceedings of the 12th World Conference on Titanium
Pages420-423
Number of pages4
StatePublished - 2012
Event12th World Conference on Titanium, Ti 2011 - Beijing, China
Duration: 19 Jun 201124 Jun 2011

Publication series

NameTi 2011 - Proceedings of the 12th World Conference on Titanium
Volume1

Conference

Conference12th World Conference on Titanium, Ti 2011
Country/TerritoryChina
CityBeijing
Period19/06/1124/06/11

Keywords

  • Annealing
  • Cold-drazun
  • Texture
  • Ti-ibNb
  • Warm-draxun

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