Correlation between the low-temperature PL spectra and Cd 0.9Zn0.1Te quality

Guoqiang Li, Xiaolu Zhang, Wanqi Jie

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

The low-temperature photoluminescence (PL) measurements revealed that Cd0.9Zn0.1Te PL spectra consisted of three regions: the near-band-edge region with an emission peak I0 situated at 1.66 eV related to the free and bound excitons, the donor-acceptor region with an emission peak I1 centred at 1.62 eV related to the impurities, and a defect-band region with an emission peak I2 centred at 1.50 eV due to the dislocations. The near-band-edge region was dominated by the donor bound exciton peak (I0) for high-quality Cd0.9Zn 0.1Te, but dominated by the acceptor bound exciton peak for low-quality Cd0.9Zn0.1Te. For all high- and low-quality Cd0.9Zn0.1Te, the full width at half maximum of I 0 can be used to evaluate the overall quality of the crystal, and the PL peak intensity ratios of I1/I0 and I 2/I0 could be employed to reflect the impurity concentration and dislocation density of the crystal, respectively.

Original languageEnglish
Pages (from-to)86-89
Number of pages4
JournalSemiconductor Science and Technology
Volume20
Issue number1
DOIs
StatePublished - Jan 2005

Fingerprint

Dive into the research topics of 'Correlation between the low-temperature PL spectra and Cd 0.9Zn0.1Te quality'. Together they form a unique fingerprint.

Cite this