Computational Prediction of SiCf/SiC Stiffness and Thermal Residual Stress by 3D Micro-scale FEA Methods

Fei Li, Bin Liu, Nongyue Gao, Xiaoping Zhong, Min Chang, Laifei Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Ceramic matrix composites (CMCs, e.g. SiCf/SiC) are applied widely in hot-section components of aeronautics and astronautics. The macroscale mechanical properties of CMCs and the thermal residual stress (TRS) created during preparation can be easily obtained by standard tests. However, in the material design stage, it will result in waste only through testing validation. Precise virtual simulation technology (VST) is extremely useful on predicting materials’ performance and giving optimal strategies to materials designers. Under this mean, the present work is mainly focusing on predicting the macro-stiffness and TRS for SiCf/SiC composites. The microscale representative volume elements (RVE) model with period boundary condition (PBC) is used to calculate the elastic modulus in fiber direction and two fiber’s normal directions adn shear modulus of in-plane and out-plane. Besides, in the 3D microscale FEA model specialized for TRS calculation, parameters effects of homogeneous and anisotropic interphase modulus and interphase thickness are investigated.

Original languageEnglish
Title of host publicationProceedings of the 5th China Aeronautical Science and Technology Conference
PublisherSpringer Science and Business Media Deutschland GmbH
Pages177-183
Number of pages7
ISBN (Print)9789811674228
DOIs
StatePublished - 2022
Event5th China Aviation Science and Technology Conference, 2021 - Jiaxing, China
Duration: 1 Jan 2021 → …

Publication series

NameLecture Notes in Electrical Engineering
Volume821 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

Conference5th China Aviation Science and Technology Conference, 2021
Country/TerritoryChina
CityJiaxing
Period1/01/21 → …

Keywords

  • FEA
  • Micro-structure
  • Period boundary condition
  • SiC/SiC
  • TRS

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