Abstract
Si 3N 4-SiC composite ceramics were fabricated by chemical vapor infiltration using porous Si 3N 4 ceramic as preform. The average grain size of SiC was 30 nm. Relationship between SiC content and relative complex permittivity of Si 3N 4-SiC within the frequency range of 8.2-12.4 GHz (X-band) was investigated. The average real part of relative complex permittivity e{open}' of Si 3N 4-SiC increased from 3.7 to 14.9 and the relative imaginary part e{open}' increased from 0.017 to 13.4 when the content of SiC increased from 0 to 10 vol.%. The Si 3N 4-SiC ceramic with 3 vol.% SiC achieved a reflection loss below -10 dB (90% absorption) at 8.6-11.4 GHz, and the minimum value was -27.1 dB at 9.8 GHz when the sample thickness was 2.5 mm. The excellent microwave absorbing abilities of Si 3N 4-SiC ceramic were attributed to the interfacial polarization at interface between Si 3N 4 and SiC and at grain boundary between SiC nanocrystals.
Original language | English |
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Pages (from-to) | 745-750 |
Number of pages | 6 |
Journal | Journal of Materials Science and Technology |
Volume | 28 |
Issue number | 8 |
DOIs | |
State | Published - Aug 2012 |
Keywords
- Dielectric properties
- Reflection loss
- Si N
- SiC