Automatic Radar Antenna Scan Type Recognition Based on the Residual Network

Yanyun Gong, Danzi Qubi, Yifei Fan, Shuting Tang, Zixun Guo, Xiangyang Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the radar electronic reconnaissance field, radar antenna scanning type recognition helps infer the function, working mode, and scanning pattern of the emitters, which is important for radar radiation source identification and threat level assessment. The recognition rate of the traditional machine learning and radial basis function based methods decreases in complex electromagnetic environments. In order to improve the recognition accuracy and reduce manual intervention, this paper proposes a radar antenna scanning recognition method based on the Residual Network, which enhances the recognition accuracy and efficiency. The simulated results of 7 different scanning modes show that the recognition accuracy can reach about 98.7%.

Original languageEnglish
Title of host publication2024 IEEE 7th International Conference on Electronic Information and Communication Technology, ICEICT 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages677-680
Number of pages4
ISBN (Electronic)9798350384437
DOIs
StatePublished - 2024
Event7th IEEE International Conference on Electronic Information and Communication Technology, ICEICT 2024 - Xi'an, China
Duration: 31 Jul 20242 Aug 2024

Publication series

Name2024 IEEE 7th International Conference on Electronic Information and Communication Technology, ICEICT 2024

Conference

Conference7th IEEE International Conference on Electronic Information and Communication Technology, ICEICT 2024
Country/TerritoryChina
CityXi'an
Period31/07/242/08/24

Keywords

  • convolutional neural network
  • Electronic warfare
  • Radar antenna scanning recognition

Fingerprint

Dive into the research topics of 'Automatic Radar Antenna Scan Type Recognition Based on the Residual Network'. Together they form a unique fingerprint.

Cite this