An interdigital electrode probe for detection, localization and evaluation of surface notch-type damage in metals

Lanshuo Li, Xiaoqing Yang, Yang Yin, Jianping Yuan, Xu Li, Lixin Li, Kama Huang

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Available microwave notch-type damage detection sensors are typically based on monitoring frequency shift or magnitude changes. However, frequency shift testing needs sweep-frequency data that make scanning detection becomes difficult and time-consuming. This work presents a microwave near-field nondestructive testing sensor for detecting sub-millimeter notch-type damage detection in metallic surfaces. The sensor is loaded with an interdigital electrode element in an open-ended coaxial. It is simple to fabricate and inexpensive, as it is etched on the RC4003 patch by using printed circuit board technology. The detection is achieved by monitoring changes in reflection amplitude, which is caused by perturbing the electromagnetic field around the interdigital structure. The proposed sensor was tested on a metallic plate with different defects, and the experimental results indicated that the interdigital electrode probe can determine the orientation, localization and dimension of surface notch-type damage.

Original languageEnglish
Article number371
JournalSensors
Volume18
Issue number2
DOIs
StatePublished - Feb 2018

Keywords

  • Interdigital electrode (IDE)
  • Metallic materials
  • Microwave near-field detection
  • Surface notch-type damage

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