Abstract
The effect of semi-solid isothermal treatments on electrical conductivities of Cu-Ni-Si alloys with the addition of 10 wt.%Ni + Si was studied in conjunction with different solid-state solution treatments. The microstructure and phase composition of as-treated samples were investigated. The results showed that after semi-solid isothermal treatments at 1000°C, both the complete decomposition of δ-Ni 2Si phases in Cu-rich solutions and the remelting of eutectic phases at the grain boundaries had occurred. As a result, an abnormal improvement on the electrical conductivities of Cu-Ni-Si alloys could be obtained due to lower scatter effect of Ni and Si atoms on electron movement, resulting from more Ni and Si atoms in Cu-rich solutions entered into the eutectic melts at the grain boundaries by solid-state diffusion.
Original language | English |
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Pages (from-to) | 107-109 |
Number of pages | 3 |
Journal | Materials Letters |
Volume | 77 |
DOIs | |
State | Published - 15 Jun 2012 |
Keywords
- Cu-Ni-Si alloys
- Electrical properties
- Microstructure
- Semi-solid treatment