A Taxonomy and Evaluation of Dense Light Field Depth Estimation Algorithms

Ole Johannsen, Katrin Honauer, Bastian Goldluecke, Anna Alperovich, Federica Battisti, Yunsu Bok, Michele Brizzi, Marco Carli, Gyeongmin Choe, Maximilian Diebold, Marcel Gutsche, Hae Gon Jeon, In So Kweon, Jaesik Park, Jinsun Park, Hendrik Schilling, Hao Sheng, Lipeng Si, Michael Strecke, Antonin SulcYu Wing Tai, Qing Wang, Ting Chun Wang, Sven Wanner, Zhang Xiong, Jingyi Yu, Shuo Zhang, Hao Zhu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

98 Scopus citations

Abstract

This paper presents the results of the depth estimation challenge for dense light fields, which took place at the second workshop on Light Fields for Computer Vision (LF4CV) in conjunction with CVPR 2017. The challenge consisted of submission to a recent benchmark [7], which allows a thorough performance analysis. While individual results are readily available on the benchmark web page http://www.lightfield-analysis.net, we take this opportunity to give a detailed overview of the current participants. Based on the algorithms submitted to our challenge, we develop a taxonomy of light field disparity estimation algorithms and give a report on the current state-ofthe- art. In addition, we include more comparative metrics, and discuss the relative strengths and weaknesses of the algorithms. Thus, we obtain a snapshot of where light field algorithm development stands at the moment and identify aspects with potential for further improvement.

Original languageEnglish
Title of host publicationProceedings - 30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
PublisherIEEE Computer Society
Pages1795-1812
Number of pages18
ISBN (Electronic)9781538607336
DOIs
StatePublished - 22 Aug 2017
Event30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017 - Honolulu, United States
Duration: 21 Jul 201726 Jul 2017

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2017-July
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference30th IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2017
Country/TerritoryUnited States
CityHonolulu
Period21/07/1726/07/17

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