A self-paced multiple-instance learning framework for co-saliency detection

Dingwen Zhang, Deyu Meng, Chao Li, Lu Jiang, Qian Zhao, Junwei Han

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

121 Scopus citations

Abstract

As an interesting and emerging topic, co-saliency detection aims at simultaneously extracting common salient objects in a group of images. Traditional co-saliency detection approaches rely heavily on human knowledge for designing hand-crafted metrics to explore the intrinsic patterns underlying co-salient objects. Such strategies, however, always suffer from poor generalization capability to flexibly adapt various scenarios in real applications, especially due to their lack of insightful understanding of the biological mechanisms of human visual co-attention. To alleviate this problem, we propose a novel framework for this task, by naturally reformulating it as a multiple-instance learning (MIL) problem and further integrating it into a self-paced learning (SPL) regime. The proposed framework on one hand is capable of fitting insightful metric measurements and discovering common patterns under co-salient regions in a self-learning way by MIL, and on the other hand tends to promise the learning reliability and stability by simulating the human learning process through SPL. Experiments on benchmark datasets have demonstrated the effectiveness of the proposed framework as compared with the state-of-the-arts.

Original languageEnglish
Title of host publication2015 International Conference on Computer Vision, ICCV 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages594-602
Number of pages9
ISBN (Electronic)9781467383912
DOIs
StatePublished - 17 Feb 2015
Event15th IEEE International Conference on Computer Vision, ICCV 2015 - Santiago, Chile
Duration: 11 Dec 201518 Dec 2015

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
Volume2015 International Conference on Computer Vision, ICCV 2015
ISSN (Print)1550-5499

Conference

Conference15th IEEE International Conference on Computer Vision, ICCV 2015
Country/TerritoryChile
CitySantiago
Period11/12/1518/12/15

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