摘要
Using first-principles density-functional calculations of the total energy, we performed a systematic study of the diffusion activation energies of O2 and CO in SiO2 and Si1-xCxO2. Our results suggest that the dense Si1-xCxO2 (e.g., Si2CO6) layer may play a critical role in the SiC thermal oxidation process. The out-diffusion of CO through SiO2 or Si2CO6 is the controlling step of the SiC thermal oxidation. Known experimental data are explained well by our results.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 654-657 |
| 页数 | 4 |
| 期刊 | Scripta Materialia |
| 卷 | 62 |
| 期 | 9 |
| DOI | |
| 出版状态 | 已出版 - 5月 2010 |
指纹
探究 'The rate-limiting step in the thermal oxidation of silicon carbide' 的科研主题。它们共同构成独一无二的指纹。引用此
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