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The rate-limiting step in the thermal oxidation of silicon carbide

科研成果: 期刊稿件文章同行评审

19 引用 (Scopus)

摘要

Using first-principles density-functional calculations of the total energy, we performed a systematic study of the diffusion activation energies of O2 and CO in SiO2 and Si1-xCxO2. Our results suggest that the dense Si1-xCxO2 (e.g., Si2CO6) layer may play a critical role in the SiC thermal oxidation process. The out-diffusion of CO through SiO2 or Si2CO6 is the controlling step of the SiC thermal oxidation. Known experimental data are explained well by our results.

源语言英语
页(从-至)654-657
页数4
期刊Scripta Materialia
62
9
DOI
出版状态已出版 - 5月 2010

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