Study on Te-rich phase in Zn_1-xCr_xTe diluted magnetic semiconductor ingot grown by Te-solvent method

Zn_1-xCr_xTe crystal was grown by tellurium solvent method. The distribution and the shape of the Te-rich phase on different position of the ingot was studied by the infrared transmission microscopy and the scanning electron microscopy. It was found that the ingot is covered by Te-rich layers. Tellurium inclusions are less in the middle part of Zn_1-xCr_xTe crystal, but tellurium is more likely to concentrate on the grain boundaries. Hexagonal tellurium inclusions were observed inside the grains. The shape of the tellurium inclusions in the grain boundaries are irregular.