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Spectral-domain optical coherence tomography for conformal coating thickness measurement on printed circuit board

  • Xiao Shao
  • , Xiaojun Yu
  • , Xinjian Chen
  • , Linbo Liu
  • , Zhaogen Chen
  • , Jianhua Mo
  • Soochow University
  • Nanyang Technological University

科研成果: 书/报告/会议事项章节会议稿件同行评审

1 引用 (Scopus)

摘要

Conformal coating is a thin film used for protecting printed circuit boards (PCBs) from harsh environmental conditions, which reduces the failure rate of PCBs. The thickness of conformal coating is one of the key factors determining the protection efficacy on PCB. Therefore, the thickness measurement is highly desired to qualify the conformal coating. In this study, we propose to employ high-resolution spectral-domain optical coherence tomography (SD-OCT) for measuring the conformal coating thickness. An SD-OCT with axial resolution of 1.72 μm is developed. The system can provide cross-sectional imaging of the conformal coating layer. Then a boundary detection algorithm is developed to identify the coating layer from the OCT image and eventually calculate the thickness of the coating layer. Our proposed method is evaluated through comparing with metallographic slicing method, which cuts PCB into cross-section and measure conformal coating thickness under a microscope. The results demonstrate that our method produces a very consistent measurement results as compared to metallographic slicing method. In addition to the good accuracy, our algorithm's computation load is low (about one hundred milliseconds per B-scan), indicating the potential to achieve on-line inspection of coating thickness.

源语言英语
主期刊名Optical Metrology and Inspection for Industrial Applications V
编辑Toru Yoshizawa, Song Zhang, Sen Han, Sen Han
出版商SPIE
ISBN(电子版)9781510622364
DOI
出版状态已出版 - 2018
活动Optical Metrology and Inspection for Industrial Applications V 2018 - Beijing, 中国
期限: 11 10月 201813 10月 2018

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10819
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Optical Metrology and Inspection for Industrial Applications V 2018
国家/地区中国
Beijing
时期11/10/1813/10/18

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