TY - JOUR
T1 - Robust Skew-t Kalman Filter for USBL Tightly Integrated Positioning System Under Measurement Uncertainties
AU - Xu, Ruoyu
AU - Zhao, Chunhui
AU - Lyu, Yang
AU - Xu, Honghao
AU - Song, Yanyan
N1 - Publisher Copyright:
© 2026 IEEE.
PY - 2026
Y1 - 2026
N2 - Underwater ultrashort baseline (USBL) positioning systems suffer from significant estimation errors due to complex noise characteristics. Our analysis indicates that these errors manifest distinct skewed and heavy-tailed statistical characteristics, primarily attributed to system biases, time delays, and multipath effects. To effectively mitigate these issues, we propose a novel Kalman filter (KF) approach utilizing a skew-t-based Kalman filter (SKF). The SKF employs a hierarchical variational Bayesian (VB) approach to resolve linearization challenges caused by distribution asymmetry, using a structured likelihood representation of measurement errors. Simulations and field tests demonstrated that the SKF method improved accuracy by more than 56% in the USBL positioning system.
AB - Underwater ultrashort baseline (USBL) positioning systems suffer from significant estimation errors due to complex noise characteristics. Our analysis indicates that these errors manifest distinct skewed and heavy-tailed statistical characteristics, primarily attributed to system biases, time delays, and multipath effects. To effectively mitigate these issues, we propose a novel Kalman filter (KF) approach utilizing a skew-t-based Kalman filter (SKF). The SKF employs a hierarchical variational Bayesian (VB) approach to resolve linearization challenges caused by distribution asymmetry, using a structured likelihood representation of measurement errors. Simulations and field tests demonstrated that the SKF method improved accuracy by more than 56% in the USBL positioning system.
KW - Hierarchical variational Bayesian (VB)
KW - skew-t distribution
KW - skew-t- based Kalman filter
KW - tightly integrated position system
KW - ultrashort baseline (USBL)
UR - https://www.scopus.com/pages/publications/105036726797
U2 - 10.1109/TIM.2026.3682810
DO - 10.1109/TIM.2026.3682810
M3 - 文章
AN - SCOPUS:105036726797
SN - 0018-9456
VL - 75
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 9702112
ER -