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Reliability evaluation for an electronic system subject to competing risks of dependent soft and hard failures

  • Shuai Zhao
  • , Viliam Makis
  • , Shaowei Chen
  • , Yong Li
  • University of Toronto
  • Northwestern Polytechnical University Xian

科研成果: 书/报告/会议事项章节会议稿件同行评审

5 引用 (Scopus)

摘要

Reliability evaluation plays an essential role in prognostics and health management for electronic systems. This paper proposes a new method for reliability evaluation of a degrading electronic system subject to competing risks of dependent soft and hard failures. The soft failure is described by a nonstationary Gamma process exceeding the predefined critical level. In the previous works the failure modes were considered to be independent, while in this paper the dependent relationship is facilitated using the Cox's proportional hazard model that incorporates the degradation process as a time-varying covariate. To make the evaluation feasible, an approximation technique is applied in both degradation path and time axis, thereby all the reliability quantities can be derived and calculated with basic manipulations of the transition probability matrix. Finally, the performance and effectiveness of the proposed method are illustrated and analyzed in a numerical study.

源语言英语
主期刊名Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
编辑Qiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9781509027781
DOI
出版状态已出版 - 16 1月 2017
活动7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, 中国
期限: 19 10月 201621 10月 2016

出版系列

姓名Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

会议

会议7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
国家/地区中国
Chengdu, Sichuan
时期19/10/1621/10/16

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