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Rapidly identify the critical parameter of mems device based on element model library

  • Northwestern Polytechnical University Xian
  • Hong Kong Polytechnic University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

The purpose of this paper is to introduce a simplified yet efficient method to identify the critical parameter of MEMS device based on rapid computer experiments instead of expensive physical experiments. The prototype model of MEMS device is rapidly established by connecting reusable and parameterized element models based on developed element model library. Critical parameters are identified and optimal parameter assemblies are obtained using Taguchi method based on computational experiments of the prototype model. A typical MEMS device-micro resonator is used for demonstrating the design methodology. The method enables the designer to rapidly identify critical parameter of a new MEMS device in early stage of design.

源语言英语
主期刊名MEMS/NEMS Nano Technology
出版商Trans Tech Publications Ltd
684-689
页数6
ISBN(印刷版)9783037851753
DOI
出版状态已出版 - 2011

出版系列

姓名Key Engineering Materials
483
ISSN(印刷版)1013-9826
ISSN(电子版)1662-9795

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