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Passivation of Transition Metal Dichalcogenides Monolayers with a Surface-Confined Atomically Thick Sulfur Layer

  • Xiaojian Wang
  • , Qingliang Feng
  • , Shichen Xu
  • , Jing Shang
  • , Yan Zhao
  • , Shanshan Wang
  • , Xi Zhou
  • , Liling Chen
  • , Xingfeng Lei
  • , Chun Li
  • , Liangzhi Kou
  • , Qiuyu Zhang
  • , Jin Zhang
  • Lanzhou University
  • Northwestern Polytechnical University Xian
  • Peking University
  • Queensland University of Technology

科研成果: 期刊稿件文章同行评审

1 引用 (Scopus)

摘要

Surface passivation can eliminate the charge doping of monolayer transition metal dichalcogenides (TMDs) during the device fabrication, which is important for the large-scale production of ultra-stable materials and high-performance devices. The uniformity and atomical thickness of the passivating layers with a low dielectric constant (κ) are essentials to preserving the intrinsic properties of monolayer TMDs in harsh environments. Herein, a surface-confined mechanism is developed to encapsulate TMDs monolayers by atomically thin sulfur layers with high spatial homogeneity (named S–MX2). The bottom bilayer S atoms are strongly confined by the upper S monolayers when the low-κ S reaches three layers on the surface of TMDs, which spontaneously renders the uniform distribution on a large scale. The intrinsic electrical and optical properties of monolayer S–MX2 are well maintained and show excellent long-term stability under harsh environments. Herein this work, a way to eliminate surface doping of monolayer TMDs for their practical application in large-area-integrated circuits is provided.

源语言英语
文章编号2100224
期刊Small Structures
3
4
DOI
出版状态已出版 - 4月 2022

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