摘要
A C/SiC composite panel with defects of known size and of familiar nature was manufactured successfully for nondestructive evaluation. A computed tomography (CT) system was used to detect embedded defects. The results show that CT imaging corresponds well with the designed defects. The defect-embedded composites undergo relatively greater loss in tensile strength and failure strain than the as-received samples, although their initial Young's moduli are almost identical. It is also observed that the embedded defects make a significant contribution toward the initiation and accumulation of the damage in the composites, which result eventually in the early failure of the composite.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 378-386 |
| 页数 | 9 |
| 期刊 | International Journal of Applied Ceramic Technology |
| 卷 | 4 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 8月 2007 |
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