Microstructure and field emission properties of the Si-TaSi2 eutectic in situ composites by electron beam floating zone melting technique

Chunjuan Cui; Jun Zhang; Zhiwei Jia; Haijun Su; Lin Liu; Hengzhi Fu

doi:10.1016/j.jcrysgro.2007.10.023

Microstructure and field emission properties of the Si-TaSi₂ eutectic in situ composites by electron beam floating zone melting technique

Chunjuan Cui
, Jun Zhang
, Zhiwei Jia
, Haijun Su
, Lin Liu
, Hengzhi Fu

材料学院

Northwestern Polytechnical University Xian

科研成果: 期刊稿件 › 文章 › 同行评审

15 引用（Scopus）

摘要

The directionally solidified Si-TaSi₂ eutectic in situ composites, which have highly aligned and uniformly distributed TaSi₂ fibers embedded in the Si continuous matrix, are obtained by electron beam floating zone melting (EBFZM) technique at the solidification rate range 0.3-9.0 mm/min. The preferential orientation of the Si-TaSi₂ eutectic is also studied by selected area electron diffraction (SAED), which is [0 1̄ 1̄]Si∥[0 0 0 1]TaSi₂ and (0 1̄ 1)Si∥(0 1̄ 1 1)TaSi₂. Moreover, field emission properties of the Si-TaSi₂ eutectic in situ composites are investigated by transparent anode imaging technology. Approximately straight F-N curves show that this material has excellent field emission properties.

源语言	英语
页（从-至）	71-77
页数	7
期刊	Journal of Crystal Growth
卷	310
期	1
DOI	https://doi.org/10.1016/j.jcrysgro.2007.10.023
出版状态	已出版 - 4 1月 2008

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10.1016/j.jcrysgro.2007.10.023

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@article{1c0da3ecda9142b5a51b3d007102e296,

title = "Microstructure and field emission properties of the Si-TaSi2 eutectic in situ composites by electron beam floating zone melting technique",

abstract = "The directionally solidified Si-TaSi2 eutectic in situ composites, which have highly aligned and uniformly distributed TaSi2 fibers embedded in the Si continuous matrix, are obtained by electron beam floating zone melting (EBFZM) technique at the solidification rate range 0.3-9.0 mm/min. The preferential orientation of the Si-TaSi2 eutectic is also studied by selected area electron diffraction (SAED), which is [0 {\=1} {\=1}]Si∥[0 0 0 1]TaSi2 and (0 {\=1} 1)Si∥(0 {\=1} 1 1)TaSi2. Moreover, field emission properties of the Si-TaSi2 eutectic in situ composites are investigated by transparent anode imaging technology. Approximately straight F-N curves show that this material has excellent field emission properties.",

keywords = "A1. Directional solidification, A1. Eutectic in situ composite, A1. Transmission electron microscopy, A2. Electron beam floating zone melting, B2. Si-TaSi, B3. Field emission",

author = "Chunjuan Cui and Jun Zhang and Zhiwei Jia and Haijun Su and Lin Liu and Hengzhi Fu",

year = "2008",

month = jan,

day = "4",

doi = "10.1016/j.jcrysgro.2007.10.023",

language = "英语",

volume = "310",

pages = "71--77",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - Microstructure and field emission properties of the Si-TaSi2 eutectic in situ composites by electron beam floating zone melting technique

AU - Cui, Chunjuan

AU - Zhang, Jun

AU - Jia, Zhiwei

AU - Su, Haijun

AU - Liu, Lin

AU - Fu, Hengzhi

PY - 2008/1/4

Y1 - 2008/1/4

N2 - The directionally solidified Si-TaSi2 eutectic in situ composites, which have highly aligned and uniformly distributed TaSi2 fibers embedded in the Si continuous matrix, are obtained by electron beam floating zone melting (EBFZM) technique at the solidification rate range 0.3-9.0 mm/min. The preferential orientation of the Si-TaSi2 eutectic is also studied by selected area electron diffraction (SAED), which is [0 1̄ 1̄]Si∥[0 0 0 1]TaSi2 and (0 1̄ 1)Si∥(0 1̄ 1 1)TaSi2. Moreover, field emission properties of the Si-TaSi2 eutectic in situ composites are investigated by transparent anode imaging technology. Approximately straight F-N curves show that this material has excellent field emission properties.

AB - The directionally solidified Si-TaSi2 eutectic in situ composites, which have highly aligned and uniformly distributed TaSi2 fibers embedded in the Si continuous matrix, are obtained by electron beam floating zone melting (EBFZM) technique at the solidification rate range 0.3-9.0 mm/min. The preferential orientation of the Si-TaSi2 eutectic is also studied by selected area electron diffraction (SAED), which is [0 1̄ 1̄]Si∥[0 0 0 1]TaSi2 and (0 1̄ 1)Si∥(0 1̄ 1 1)TaSi2. Moreover, field emission properties of the Si-TaSi2 eutectic in situ composites are investigated by transparent anode imaging technology. Approximately straight F-N curves show that this material has excellent field emission properties.

KW - A1. Directional solidification

KW - A1. Eutectic in situ composite

KW - A1. Transmission electron microscopy

KW - A2. Electron beam floating zone melting

KW - B2. Si-TaSi

KW - B3. Field emission

UR - https://www.scopus.com/pages/publications/36549004002

U2 - 10.1016/j.jcrysgro.2007.10.023

DO - 10.1016/j.jcrysgro.2007.10.023

M3 - 文章

AN - SCOPUS:36549004002

SN - 0022-0248

VL - 310

SP - 71

EP - 77

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 1

ER -

Microstructure and field emission properties of the Si-TaSi2 eutectic in situ composites by electron beam floating zone melting technique

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Microstructure and field emission properties of the Si-TaSi₂ eutectic in situ composites by electron beam floating zone melting technique