MicroCT characterization on microstructure of C/SiC composites

Nondestructive three-dimensional structure of 3D C/SiC composites fabricated by chemical vapor infiltration(CVI) was characterized using X-ray microcomputed tomography(MicroCT). The current study was undertaken to assess the capabilities and limitations of MicroCT for the characterization of C/SiC composites. Results demonstrate that MicroCT can facilitate characterization of fabric morphology, defects(porosity and the different densities of SiC matrix) in 3D C/SiC composites. A gas retention and viscous flow formation in the preform was revealed in the light of three-dimensional porosity. A nodular surface morphology of SiC matrix fabricated by CVI was observed by reconstructing the matrix porosity-wall. Comparing with the SEM surface morphology of SiC coating fabricated by chemical vapor deposition(CVD), pressure difference between the inner and outer preform was demonstrated.