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Mechanical behavior of glass with different roughness and its influence on TGV reliability

  • Xu Long
  • , Xiaohan Ma
  • , Ming Liu
  • , Bin Yang
  • , Hongbin Shi
  • , Chengqiang Cui
  • Northwestern Polytechnical University Xian
  • Fuzhou University
  • Guangdong University of Technology
  • Huawei Technologies Co., Ltd.

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Through-glass via (TGV) structures play a critical role in advanced 3D electronic packaging, offering superior electrical insulation and dimensional stability. Their mechanical integrity is critical to ensuring the long-term reliability of vertically integrated systems. As the demand for high-density, high-performance, and heterogeneous integration continues to grow, TGV technology is becoming increasingly important in enabling compact, thermally stable, and highly reliable 3D packaging solutions. Nevertheless, the surface roughness of glass significantly affects metal deposition, interface bonding, and mechanical behavior. Optical microscopy shows that smoother glass has smaller, denser particles, while rougher surfaces exhibit larger, irregular particles with clear boundaries. As the first exploration regarding the TGV glass material through scratch tests, this study investigates hardness, fracture toughness, friction, and interfacial bonding, elucidating how roughness affects mechanical properties of borosilicate glass. It also shows that smoother glass has uniform hardness and controllable crack propagation, thereby reducing stress concentration. Although rougher glass enhances mechanical interlocking and bonding strength, it often accumulates residual stress under thermal or mechanical loads. To unveil the underlying mechanism of the observation that rough surfaces increase the risk of microcracks, the finite element model (FEM) is established to study the force conditions of glasses with different roughnesses under scratch tests. These findings provide guidance for optimizing TGV processes, improving reliability, and supporting their applications in high-density ICs, 5G, and advanced optoelectronic packaging.

源语言英语
主期刊名2025 26th International Conference on Electronic Packaging Technology, ICEPT 2025
出版商Institute of Electrical and Electronics Engineers Inc.
版本2025
ISBN(电子版)9781665465809
DOI
出版状态已出版 - 2025
活动26th International Conference on Electronic Packaging Technology, ICEPT 2025 - Shanghai, 中国
期限: 5 8月 20257 8月 2025

会议

会议26th International Conference on Electronic Packaging Technology, ICEPT 2025
国家/地区中国
Shanghai
时期5/08/257/08/25

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