Measurement of the nonlinear refraction index of Nd:YVO4 crystal by single-beam Z scan

Jun Guan; Xia Li; Guanghua Cheng; Guofu Chen; Xun Hou

Measurement of the nonlinear refraction index of Nd:YVO₄ crystal by single-beam Z scan

Jun Guan
, Xia Li
, Guanghua Cheng
, Guofu Chen
, Xun Hou

CAS - Xi'an Institute of Optics and Precision Mechanics
University of Chinese Academy of Sciences
Henan University

科研成果: 期刊稿件 › 文章 › 同行评审

5 引用（Scopus）

摘要

In this measurement of the nonlinear refraction index of 4 mm thick Nd:YVO₄ crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.

源语言	英语
页（从-至）	1172-1175
页数	4
期刊	Guangzi Xuebao/Acta Photonica Sinica
卷	34
期	8
出版状态	已出版 - 8月 2005
已对外发布	是

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引用此

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title = "Measurement of the nonlinear refraction index of Nd:YVO4 crystal by single-beam Z scan",

abstract = "In this measurement of the nonlinear refraction index of 4 mm thick Nd:YVO4 crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.",

keywords = "Nd:YVO, Nonlinear refraction index, Z scan",

author = "Jun Guan and Xia Li and Guanghua Cheng and Guofu Chen and Xun Hou",

year = "2005",

month = aug,

language = "英语",

volume = "34",

pages = "1172--1175",

journal = "Guangzi Xuebao/Acta Photonica Sinica",

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TY - JOUR

T1 - Measurement of the nonlinear refraction index of Nd:YVO4 crystal by single-beam Z scan

AU - Guan, Jun

AU - Li, Xia

AU - Cheng, Guanghua

AU - Chen, Guofu

AU - Hou, Xun

PY - 2005/8

Y1 - 2005/8

N2 - In this measurement of the nonlinear refraction index of 4 mm thick Nd:YVO4 crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.

AB - In this measurement of the nonlinear refraction index of 4 mm thick Nd:YVO4 crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.

KW - Nd:YVO

KW - Nonlinear refraction index

KW - Z scan

UR - https://www.scopus.com/pages/publications/24744439503

M3 - 文章

AN - SCOPUS:24744439503

SN - 1004-4213

VL - 34

SP - 1172

EP - 1175

JO - Guangzi Xuebao/Acta Photonica Sinica

JF - Guangzi Xuebao/Acta Photonica Sinica

IS - 8

ER -

Measurement of the nonlinear refraction index of Nd:YVO4 crystal by single-beam Z scan

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Measurement of the nonlinear refraction index of Nd:YVO₄ crystal by single-beam Z scan