摘要
Pyrochlore free PbMg1/3Nb2/3O3 (PMN) thick films were prepared by using a hydrothermal process from oxide-based suspension precursors. PMN thick films have been grown on titanium substrates at 150 °C for 8 h. The effect of processing parameters such as reaction durations and mineralization conditions on perovskite phase formation on the microstructures is very critical. By controlling the operating parameters, high quality PMN thick films on titanium substrates were fabricated. The films with a single perovskite structure were smooth and the surfaces were free of micrometer scale cracks. The thickness of the film was about 20 μm. Dielectric responses of the PMN films were characterized in detail. The samples showed excellent reproducibility in the measurement of dielectric responses.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1063-1066 |
| 页数 | 4 |
| 期刊 | Ceramics International |
| 卷 | 34 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 5月 2008 |
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