摘要
Al-doped and In-doped Cd0.9Zn0.1Te crystals were grown by the modified vertical Bridgman (MVB) in the same growth conditions and characterized by various methods. The resistivity of Al-doped crystal, which shows weak p-type or weak n-type, is high in the range of 6×109-2×1010 Ω·cm, while In-doped crystal shows n-type with resistivity in the order of 105 Ω·cm. The infrared transmission spectrum shows that the IR transmittance of Al-doped crystal is flat and high from 4000-500 cm-1, while the IR transmittance of In-doped crystal is lower and decreases with the decrease of wavenumbers until to zero below 1250 cm-1. The detector prepared from Al-doped crystal obtains the energy resolution of 14% FWHM at 241Am 59.54 keV, which shows that Al-doped crystal basically satisfies the application requirements as detector materials.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 529-531+534 |
| 期刊 | Gongneng Cailiao/Journal of Functional Materials |
| 卷 | 40 |
| 期 | 4 |
| 出版状态 | 已出版 - 4月 2009 |
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