摘要
The band alignment of a (0001)CdS/CdTe heterojunction is in situ studied by synchrotron radiation photoemission spectroscopy (SRPES). The heterojunction is formed through stepwise deposition of a CdTe film on a wurtzite (0001)CdS single crystalline substrate via molecular beam epitaxy. CdS shows an upward band bending of 0.55 eV, the valence band offset ΔEV is calculated to be 0.65 eV and the conduction band offset ΔEC is 0.31 eV. The interfacial band alignment is sketched to display type-I band alignment.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 057301 |
| 期刊 | Chinese Physics Letters |
| 卷 | 29 |
| 期 | 5 |
| DOI | |
| 出版状态 | 已出版 - 5月 2012 |
指纹
探究 'In-situ SRPES study on the band alignment of (0001)CdS/CdTe Heterojunction' 的科研主题。它们共同构成独一无二的指纹。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver