FPGA testing points optimization method based on important analysis

Guochang Zhou; Xiang Gao; Xiaoling Lai; Qi Zhu; Ting Ju; Yangming Guo; Hao Wu; Qiang Zhi

doi:10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis

Guochang Zhou
, Xiang Gao
, Xiaoling Lai
, Qi Zhu
, Ting Ju
, Yangming Guo
, Hao Wu
, Qiang Zhi

网络空间安全学院

Academy of Space Technology
Northwestern Polytechnical University Xian

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

1 引用（Scopus）

摘要

From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

源语言	英语
主期刊名	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016
编辑	Qiang Miao, Zhaojun Li, Ming J. Zuo, Liudong Xing, Zhigang Tian
出版商	Institute of Electrical and Electronics Engineers Inc.
ISBN（电子版）	9781509027781
DOI	https://doi.org/10.1109/PHM.2016.7819773
出版状态	已出版 - 16 1月 2017
活动	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 - Chengdu, Sichuan, 中国期限: 19 10月 2016 → 21 10月 2016

出版系列

姓名	Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

会议

会议	7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016
国家/地区	中国
市	Chengdu, Sichuan
时期	19/10/16 → 21/10/16

访问文件

10.1109/PHM.2016.7819773

其它文件与链接

链接到 Scopus 的出版物

引用此

Zhou, G., Gao, X., Lai, X., Zhu, Q., Ju, T., Guo, Y., Wu, H., & Zhi, Q. (2017). FPGA testing points optimization method based on important analysis. 在 Q. Miao, Z. Li, M. J. Zuo, L. Xing, & Z. Tian (编辑), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016 文章 7819773 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PHM.2016.7819773

Zhou, Guochang ; Gao, Xiang ; Lai, Xiaoling 等. / FPGA testing points optimization method based on important analysis. Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. 编辑 / Qiang Miao ; Zhaojun Li ; Ming J. Zuo ; Liudong Xing ; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

@inproceedings{0716debee1fa4bc68efc2a756179dc48,

title = "FPGA testing points optimization method based on important analysis",

abstract = "From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.",

keywords = "FPGA, Important analysis, Optimization, Soft error of single event effect, Testing points",

author = "Guochang Zhou and Xiang Gao and Xiaoling Lai and Qi Zhu and Ting Ju and Yangming Guo and Hao Wu and Qiang Zhi",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016 ; Conference date: 19-10-2016 Through 21-10-2016",

year = "2017",

month = jan,

day = "16",

doi = "10.1109/PHM.2016.7819773",

language = "英语",

series = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "Qiang Miao and Zhaojun Li and Zuo, \{Ming J.\} and Liudong Xing and Zhigang Tian",

booktitle = "Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016",

}

Zhou, G, Gao, X, Lai, X, Zhu, Q, Ju, T, Guo, Y, Wu, H & Zhi, Q 2017, FPGA testing points optimization method based on important analysis. 在 Q Miao, Z Li, MJ Zuo, L Xing & Z Tian (编辑), Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016., 7819773, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016, Institute of Electrical and Electronics Engineers Inc., 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016, Chengdu, Sichuan, 中国, 19/10/16. https://doi.org/10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis. / Zhou, Guochang; Gao, Xiang; Lai, Xiaoling 等.
Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. 编辑 / Qiang Miao; Zhaojun Li; Ming J. Zuo; Liudong Xing; Zhigang Tian. Institute of Electrical and Electronics Engineers Inc., 2017. 7819773 (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016).

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

TY - GEN

T1 - FPGA testing points optimization method based on important analysis

AU - Zhou, Guochang

AU - Gao, Xiang

AU - Lai, Xiaoling

AU - Zhu, Qi

AU - Ju, Ting

AU - Guo, Yangming

AU - Wu, Hao

AU - Zhi, Qiang

PY - 2017/1/16

Y1 - 2017/1/16

N2 - From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

AB - From the space and time dimension, the FPGA circuit is devised some levels with 'computing unit + memory/register' via analyzing the characteristics of the FPGA circuit. Combined with the location importance, the connection degree among the nodes and their own soft error probability, an importance analysis model is proposed. And then the testing points are optimized based on the importance of each node using the proposed importance analysis model. The test results indicate that the method is a feasible optimization method.

KW - FPGA

KW - Important analysis

KW - Optimization

KW - Soft error of single event effect

KW - Testing points

UR - https://www.scopus.com/pages/publications/85015704779

U2 - 10.1109/PHM.2016.7819773

DO - 10.1109/PHM.2016.7819773

M3 - 会议稿件

AN - SCOPUS:85015704779

T3 - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

BT - Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016

A2 - Miao, Qiang

A2 - Li, Zhaojun

A2 - Zuo, Ming J.

A2 - Xing, Liudong

A2 - Tian, Zhigang

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 7th IEEE Prognostics and System Health Management Conference, PHM-Chengdu 2016

Y2 - 19 October 2016 through 21 October 2016

ER -

Zhou G, Gao X, Lai X, Zhu Q, Ju T, Guo Y 等. FPGA testing points optimization method based on important analysis. 在 Miao Q, Li Z, Zuo MJ, Xing L, Tian Z, 编辑, Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016. Institute of Electrical and Electronics Engineers Inc. 2017. 7819773. (Proceedings of 2016 Prognostics and System Health Management Conference, PHM-Chengdu 2016). doi: 10.1109/PHM.2016.7819773

FPGA testing points optimization method based on important analysis

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