摘要
(Ca0.8Sr0.2)ZrO3 ceramics were prepared using solid-state reaction process, which were sintered at 1,480 C for different sintering time (2, 4, 6, 8, 10, 12 h, respectively), their structures were characterized by X-ray diffraction (XRD), scanning electron microscopy, transmission electron microscopy and Raman spectroscopy. Rietveld refinement for the (Ca0.8Sr0.2)ZrO3 sintered for 10 h was carried out by powder XRD at room temperature and it crystallizes in orthorhombic space group Pnma [a = 5.77341(4) Å, b = 8.05569(6) Å, c = 5.63318(4) Å and V = 261.9920(30) Å3, Z = 4]. The (Ca0.8Sr0.2)ZrO3 ceramics sintered at 1,480 C for 2-12 h possessed a dielectric constant (ε r) of 23.6-27.9, a quality factor (Q × f) of 2,160-21,460 GHz and a temperature coefficient of resonant frequency (τ f ) from -14 to +13.6 ppm/ C. The Arrhenius plot of the dc electrical conductivity changed significantly with increasing sintering time.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1505-1511 |
| 页数 | 7 |
| 期刊 | Journal of Materials Science: Materials in Electronics |
| 卷 | 25 |
| 期 | 3 |
| DOI | |
| 出版状态 | 已出版 - 3月 2014 |
学术指纹
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