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Effects of low-temperature annealing on Ohmic contact of Au/p-CdZnTe

  • Xiaoqin Wang
  • , Wanqi Jie
  • , Huanyong Li
  • , Qiang Li
  • , Zewen Wang
  • Northwestern Polytechnical University Xian

科研成果: 期刊稿件文章同行评审

26 引用 (Scopus)

摘要

Effect of annealing time at 333 K in air on the ohmic property of Au/p-CdZnTe contact was studied. Through I-V measurement, it was found that Au/p-CdZnTe had excellent ohmic property after 2 h annealing. SEM and XPS analyses showed that Au atoms diffused into CdZnTe during annealing. Diffused Au did not form any compound with any element in CdZnTe, but replaced Cd sites or occupied Cd vacancy as acceptors. Thus, the heavy p-type doping layer was formed and M-p+-p ohmic contact was obtained. At the same time, about 27.01% of Te in un-deposited CdZnTe surface layer was oxided into TeO2 during 2 h annealing.

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