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Dual wavelength digital holography for improving the measurement accuracy

  • Jianglei Di
  • , Weijuan Qu
  • , Bingjing Wu
  • , Xin Chen
  • , Jianlin Zhao
  • , Anand Asundi
  • Northwestern Polytechnical University Xian
  • Ngee Ann Polytechnic
  • Nanyang Technological University

科研成果: 书/报告/会议事项章节会议稿件同行评审

8 引用 (Scopus)

摘要

In dual wavelength digital holography, a synthetic wavelength is obtained by using two lasers with different wavelengths to expand the measurement range of samples' step heights from nanometers to micrometers. However, its measurement accuracy reduces along with the expansion of measuring range and significant noise is introduced at the same time. For cases where the sample's height is smaller than the wavelength of illumination light, the measurement accuracy is very important. In this paper, a new approach of dual wavelength digital holography is presented. The synthetic wavelength is smaller than the wavelength of the two different lasers. Higher measurement accuracy can thus be achieved. The analysis and experimental results show the validity of this method.

源语言英语
主期刊名International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
DOI
出版状态已出版 - 2013
活动International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013 - Singapore, 新加坡
期限: 9 4月 201311 4月 2013

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
8769
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
国家/地区新加坡
Singapore
时期9/04/1311/04/13

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