摘要
Dislocations were introduced into CdZnTe wafers by the means of bending deformation at an elevated temperature. The average IR transmittance of CdZnTe wafers was found to be decreased to 44% after deformation from 64% before. The polarization absorption of dangling-bond electrons in dislocations should be responsible for the decrease of IR transmittance. In photoluminescence measurement, the shallow donor-acceptor pair transition peak at 1.557 eV and its first longitudinal optical phonon replica were detected in CdZnTe after deformation. In defect-related region, a new band Dcomplex located at 1.508 eV appeared, which should be attributed to defect levels introduced by dislocations.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 126-128 |
| 页数 | 3 |
| 期刊 | Materials Science and Engineering: A |
| 卷 | 432 |
| 期 | 1-2 |
| DOI | |
| 出版状态 | 已出版 - 25 9月 2006 |
学术指纹
探究 'Dislocation-induced IR absorption and photoluminescence emission in Cd0.96Zn0.04Te' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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