摘要
In the practical application of CdZnTe photon counting detectors, severe detector counting distortion can be caused by pulse pileup. A count rate correction method in this paper is proposed to solve this problem. In this method, the case where multi-photons are recorded by higher energy regions due to pulse pileup crossing the energy threshold is considered to calculate the true count rates under all energy bins. A verification method based on Poisson distribution is also proposed to evaluate the accuracy of the correction method. A 16-pixel linear array CdZnTe photon counting detector was used for verification. Taking the dual-energy bin as an example, this method was introduced, and the true count rates of the high- and low-energy bins are successfully calculated. The result was highly consistent with the verification result, which proves the reliability of the proposed method.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 108142 |
| 期刊 | Materials Science in Semiconductor Processing |
| 卷 | 173 |
| DOI | |
| 出版状态 | 已出版 - 4月 2024 |
指纹
探究 'Count rate correction for pulse pileup in CdZnTe photon counting detectors' 的科研主题。它们共同构成独一无二的指纹。引用此
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