Characterization of forced localization of disordered weakly coupled micromechanical resonators

The mode localization phenomenon of disordered weakly coupled resonators (WCRs) is being used as a novel transduction scheme to further enhance the sensitivity of micromechanical resonant sensors. In this paper, two novel characteristics of mode localization are described. First, we found that the anti-resonance loci behave as a linear function of the stiffness perturbation. The anti-resonance behavior can be regarded as a new manifestation of mode localization in the frequency domain, and mode localization occurs at a deeper level as the anti-resonance approaches closer to the resonance. The anti-resonance loci can be used to identify the symmetry of the WCRs and the locations of the perturbation. Second, by comparing the forced localization responses of the WCRs under both the single-resonator-driven (SRD) scheme and the double-resonator-driven (DRD) scheme, we demonstrated that the DRD scheme extends the linear measurement scale while sacrificing a certain amount of sensitivity. We also demonstrated experimentally that the amplitude ratio-based sensitivity under the DRD scheme is approximately an order of magnitude lower than that under the SRD scheme, that is, the amplitude ratio-based sensitivity is − 70.44% (N m⁻¹)⁻¹ under the DRD scheme, while it is − 785.6% (N m⁻¹)⁻¹ under the SRD scheme. These characteristics of mode localization are valuable for the design and control of WCR-based sensors.