TY - JOUR
T1 - Changes in the composition, structure and friction property of sputtered MoS 2 films by LEO environment exposure
AU - Gao, Xiaoming
AU - Hu, Ming
AU - Sun, Jiayi
AU - Fu, Yanlong
AU - Yang, Jun
AU - Liu, Weimin
AU - Weng, Lijun
N1 - Publisher Copyright:
© 2015 Elsevier B.V.
PY - 2015/3/1
Y1 - 2015/3/1
N2 - Radio frequency-sputtered MoS 2 films had been exposed for 43.5 h in real low earth orbit (LEO) space environment by a space environment exposure device (SEED) aboard China Shenzhou-7 manned spaceship. The composition, morphology, phase structure and friction property of the exposed films were investigated using X-ray photoelectron spectroscope (XPS), X-ray diffraction (XRD), field emission scanning electron microscope (FESEM), X-ray energy-dispersive spectroscopy (EDS) and ball-on-disk tribometer. XRD and EDS results revealed that the as-deposited MoS 2 films were characterized by a MoS x O y phase structure, in which x and y values were determined to be ∼0.65 and 1.24, respectively. XPS analysis revealed that due to space atomic oxygen attack, the film surface was oxidized to MoO 3 and MoS x O y with higher O concentration, while the partial S was lost. However, the affected depth was restricted within the surface layer because of protective function of the oxidation layer. As a result, the friction coefficient only exhibited a slight increase at initial stage of sliding friction.
AB - Radio frequency-sputtered MoS 2 films had been exposed for 43.5 h in real low earth orbit (LEO) space environment by a space environment exposure device (SEED) aboard China Shenzhou-7 manned spaceship. The composition, morphology, phase structure and friction property of the exposed films were investigated using X-ray photoelectron spectroscope (XPS), X-ray diffraction (XRD), field emission scanning electron microscope (FESEM), X-ray energy-dispersive spectroscopy (EDS) and ball-on-disk tribometer. XRD and EDS results revealed that the as-deposited MoS 2 films were characterized by a MoS x O y phase structure, in which x and y values were determined to be ∼0.65 and 1.24, respectively. XPS analysis revealed that due to space atomic oxygen attack, the film surface was oxidized to MoO 3 and MoS x O y with higher O concentration, while the partial S was lost. However, the affected depth was restricted within the surface layer because of protective function of the oxidation layer. As a result, the friction coefficient only exhibited a slight increase at initial stage of sliding friction.
KW - Atomic oxygen
KW - LEO
KW - MoS films
UR - https://www.scopus.com/pages/publications/84924082062
U2 - 10.1016/j.apsusc.2014.12.175
DO - 10.1016/j.apsusc.2014.12.175
M3 - 文章
AN - SCOPUS:84924082062
SN - 0169-4332
VL - 330
SP - 30
EP - 38
JO - Applied Surface Science
JF - Applied Surface Science
ER -