TY - GEN
T1 - Airborne particulate matter classification and concentration detection based on 3D printed virtual impactor and quartz crystal microbalance sensor
AU - Zhao, Jiuxuan
AU - Liu, Minliang
AU - Wang, Wen
AU - Xie, Jin
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/2/26
Y1 - 2016/2/26
N2 - This paper reports a miniature system for detection of airborne particulate matter (PM), which contains a virtual impactor and a quartz crystal microbalance (QCM) resonant sensor. Silicon dioxide powders with diameter in the range from 0.5 to 8 μm are successfully separated by the virtual impactor according to their size. PM concentration in a chamber is measured by the proposed monitoring system and the experimental results show that the resonant frequency of the QCM turns downward linearly with the PM mass loading increasing. The proposed monitoring system can complete measurement of PM concentration of 35 μg/m3 in only 23 seconds.
AB - This paper reports a miniature system for detection of airborne particulate matter (PM), which contains a virtual impactor and a quartz crystal microbalance (QCM) resonant sensor. Silicon dioxide powders with diameter in the range from 0.5 to 8 μm are successfully separated by the virtual impactor according to their size. PM concentration in a chamber is measured by the proposed monitoring system and the experimental results show that the resonant frequency of the QCM turns downward linearly with the PM mass loading increasing. The proposed monitoring system can complete measurement of PM concentration of 35 μg/m3 in only 23 seconds.
UR - https://www.scopus.com/pages/publications/84971009510
U2 - 10.1109/MEMSYS.2016.7421756
DO - 10.1109/MEMSYS.2016.7421756
M3 - 会议稿件
AN - SCOPUS:84971009510
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 824
EP - 827
BT - MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
Y2 - 24 January 2016 through 28 January 2016
ER -