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A weighting multivariate process capability index

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Process quality ultimately decides on the quality of electronic products. Based on analyzing and improving process capability index (PCI), microelectronics process quality of electronic products may be effectively assured. Nowadays with the rapid development in microelectronics process, Quality evaluation of processes concerns more than one quality characteristics, microelectronics process quality evaluation concerns multi quality characteristics, therefore univariate PCI is difficultly used to synthetically analyze microelectronics process quality. The paper presents a multivariate PCI based on weight factor, which provides references for assuring and improving process quality while achieving overall evaluation of process quality and is not limited to the variable number. An example of calculating multivariate PCI (MPCI) is given. Real application shows that the method presented is effective and actual.

源语言英语
主期刊名Proceedings - 2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
17-20
页数4
DOI
出版状态已出版 - 2010
活动2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010 - Yichang, 中国
期限: 12 11月 201014 11月 2010

出版系列

姓名Proceedings - 2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
1

会议

会议2010 International Conference on System Science, Engineering Design and Manufacturing Informatization, ICSEM 2010
国家/地区中国
Yichang
时期12/11/1014/11/10

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