摘要
Atomic layer deposition (ALD) technique is used to deposit SiO2 selectively onto the external surface of Mo/HZSM-5 to prepare a series of SiO2-modified Mo/HZSM-5 catalysts.The performances of prepared Mo/HZSM-5 catalysts are evaluated through methane dehydroaromatizatioin.By means of XRD,NH3-TPD,BET,XPS,TEM and other characterization measures,it is found that SiO2 is mainly deposited on the external surface of the catalyst,and the content of strong acid in the catalyst decreases,thus improving the catalyst's performance in methane dehydroaromatizatioin.
| 投稿的翻译标题 | Selective modification of Mo/HZSM-5 by atomic layer deposition and effects on methane dehydroaromatizatioin |
|---|---|
| 源语言 | 繁体中文 |
| 页(从-至) | 191-195 |
| 页数 | 5 |
| 期刊 | Xiandai Huagong/Modern Chemical Industry |
| 卷 | 39 |
| 期 | 12 |
| DOI | |
| 出版状态 | 已出版 - 20 12月 2019 |
| 已对外发布 | 是 |
关键词
- Atomic layer deposition
- Methane dehydroaromatization
- SiO
学术指纹
探究 '原子层沉积技术选择性修饰Mo/HZSM-5对甲烷无氧芳构化反应的影响' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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