ZnO thin films produced by the RF magnetron sputtering

Huawa Yu, Jing Wang, Yangan Yan, Xin Wang, Bin Gao, Hanchen Liu, Yali Du

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

ZnO thin films with (002) orientation have been deposited on Si(100) substrate by radio frequency (RF) magnetron sputtering technique. The influence of RF power and oxygen ratio on the the grain size-, the residual stress and optical properties was investigated by X-ray diffraction, transmission spectra and photoluminescence spectra. The results show that the ZnO film deposited with sputtering power (100W) and oxygen ratio(60%), can obtain its best c-axis orientation and crystallization and that tension stress of the film reaches the lowest, and a strong UV photoluminescence(PL) peak and a weak blue emission peak were observed.

Original languageEnglish
Title of host publicationProceedings of 2011 International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011
Pages2486-2489
Number of pages4
DOIs
StatePublished - 2011
Externally publishedYes
Event2011 International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011 - Harbin, China
Duration: 12 Aug 201114 Aug 2011

Publication series

NameProceedings of 2011 International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011
Volume5

Conference

Conference2011 International Conference on Electronic and Mechanical Engineering and Information Technology, EMEIT 2011
Country/TerritoryChina
CityHarbin
Period12/08/1114/08/11

Keywords

  • RF magnetron sputtering
  • Visible spectrum
  • Zinc Oxide Film

Fingerprint

Dive into the research topics of 'ZnO thin films produced by the RF magnetron sputtering'. Together they form a unique fingerprint.

Cite this