Abstract
CdMnTe (CMT) has been recently considered to be a good candidate as a promising material for the manufacture of room-temperature nuclear radiation detectors due to its better lattice strengthening, wider band gap energy and low segregation potential. This paper reports the recent progress of detector-grade CMT crystals in Northwestern Polytechnical University. CdMnTe:In ingots with diameter of 30 mm were grown using a Modified Vertical Bridgman (MVB) method. Currentvoltage measurements were performed on single element planar configuration structure with Au electrode and the obtained resistivity of CMT samples was up to 6.19×1010 Ω cm. PL spectra and IR transmittance measurement on the samples were revealed that the as-grown CMT crystal possess of high quality. IR microscope showed that the Te inclusions in CMT are 1020 μm in diameter and within the range 1×10 43×104 cm-3 in concentration. The 241Am gamma-ray spectral was obtained for the CMT single planar detector with the energy resolution of 12.38% of the 59.5 keV peak. The mobility-lifetime products for the electron and hole of the as-grown CMT crystals were evaluated to be 1.22×10-3 cm2 V -1 and 3.0×10-5 cm2 V-1, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 1062-1066 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 318 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Mar 2011 |
Keywords
- A1. Characterization
- A1. Radiation
- A2. Bridgman technique
- B1. Cadmium compounds
- B2. Semiconducting II-VI materials
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