Using conductive atomic force microscope on carbon nanotube networks

Conductive atom force microscopy observations have been performed on carbon nanotube networks. The results indicate that within an imaging range of several tens of micrometers the resistance of a carbon nanotube is much smaller than the contact resistance between two crossed carbon nanotubes and so the potential difference hardly appears along a carbon nanotube if the carbon nanotube network is electrically biased. Besides, if several semiconducting carbon nanotubes wind into a bundle, they tend to appear like metallic carbon nanotubes.