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Towards Effective Foundation Model Adaptation for Extreme Cross-Domain Few-Shot Learning

  • Northwestern Polytechnical University Xian
  • University of Electronic Science and Technology of China
  • Xi'an Institute of Posts and Telecommunications
  • Nanyang Technological University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Large-scale pre-trained foundation models have demonstrated remarkable generalization capabilities across diverse computer vision tasks through fine-tuning. However, existing fine-tuning approaches often encounter challenges in extreme cross-domain few-shot learning scenarios, primarily due to the significant domain shift between pre-training data and target tasks, as well as the scarcity of annotated target samples. To mitigate this issue, we propose a novel absorption adaptation learning framework which meticulously regularizes the fine-tuning procedure of foundation model using an expert model with the same architecture but trained from scratch on the targeted data in two aspects. On one hand, we first design a masked cross-model unidirectional reconstruction scheme, which forces the foundation model to recover the intermediate feature of the expert model in a randomly masked manner. On the other hand, a decision graph association loss is developed to encourage the consistency of token similarity matrix between these two models. By doing these, the task-relevant semantic knowledge in the expert model from both intermediate feature and the final decision levels are appropriately extracted and absorbed by the foundation model during its fine-tuning, thus mitigating the performance drop caused by domain gap and limited annotation. Sufficient experiments with further observations and analyses underpin our observation and argument. The code is available at https://github.com/NWPUZhoufei/FMA.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4582-4593
Number of pages12
ISBN (Electronic)9798331587758
DOIs
StatePublished - 2025
Event2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Honolulu, United States
Duration: 19 Oct 202523 Oct 2025

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499
ISSN (Electronic)2380-7504

Conference

Conference2025 IEEE/CVF International Conference on Computer Vision, ICCV 2025
Country/TerritoryUnited States
CityHonolulu
Period19/10/2523/10/25

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