Abstract
In this paper, time-dependent evolution properties of Ar/N2 plasma-treated Al surface for two-step D2D Al-Al direct bonding in ambient is studied. Surface roughness is assessed on the Al surface both before and after plasma treatment, demonstrating that the plasma-treated Al surface remains as an "activated"status for up to ~6 hours compared to the as-deposited Al surface. The plasma-treated Al dies exposed in ambient for different durations are bonded in ambient environment, followed by batch annealing at 300°C. The bonded dies are examined for bonding microinterface quality, bonding strength, and hermeticity. The outcomes confirm successful bonding with the desired performances. This reported bonding technology would be a promising candidate for high-throughput heterogeneous integration and advanced packaging.
| Original language | English |
|---|---|
| Title of host publication | 2025 26th International Conference on Electronic Packaging Technology, ICEPT 2025 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Edition | 2025 |
| ISBN (Electronic) | 9781665465809 |
| DOIs | |
| State | Published - 2025 |
| Event | 26th International Conference on Electronic Packaging Technology, ICEPT 2025 - Shanghai, China Duration: 5 Aug 2025 → 7 Aug 2025 |
Conference
| Conference | 26th International Conference on Electronic Packaging Technology, ICEPT 2025 |
|---|---|
| Country/Territory | China |
| City | Shanghai |
| Period | 5/08/25 → 7/08/25 |
Keywords
- aluminium-aluminium direct bonding
- ambient conditions
- plasma treatment
- time-dependent evolution study
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