Terahertz surface plasmon on semiconductor and thin dielectric surfaces

  • Tao Yang
  • , Jusheng Xin
  • , Xing'ao Li
  • , Wei Huang
  • , Qianjin Wang
  • , Yongyuan Zhu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We theoretically study the properties of terahertz (THz) surface plasmon (SP) propagating on semiconductor and thin dielectric surfaces by employing numerical calculations. The results show that the major energy of THz SP can be confined in the thin film on the surface of an InSb semiconductor. At the same time, the magnetic field dispersion curves and absorption coefficients of the structures are studied. We find that the absorption coefficient is related to the permittivity of the dielectric films. Therefore, we can sensitively detect a thin dielectric sample by broadband terahertz spectroscopy.

Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages633-636
Number of pages4
ISBN (Electronic)9781479983636
DOIs
StatePublished - 30 Sep 2015
Externally publishedYes
Event11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 - Singapore, Singapore
Duration: 1 Jun 20154 Jun 2015

Publication series

NameProceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

Conference

Conference11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
Country/TerritorySingapore
CitySingapore
Period1/06/154/06/15

Keywords

  • dielectric films
  • Surface plasmon
  • Terahertz wave

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