Abstract
SiC/SiO2 nanocables were synthesized by chemical vapor deposition using methyltrichlorosilane as precursor at atmospheric pressure. The as-prepared product was characterized by scanning electron microscopy, X-ray diffraction, energy-dispersive X-ray spectroscopy, transmission electron microscopy, high-resolution transmission electron microscopy, selected area electron diffraction, FT-IR spectrum and Raman spectroscopy. The resulting nanocables consist of a 30-50 nm diameter single-crystalline β-SiC core and a 10-20 nm thick amorphous SiO2 shell, and their lengths are up to several hundreds of micrometers. The SiC core possesses a lot of stacking faults, and grows along the [1 1 1] direction.
| Original language | English |
|---|---|
| Pages (from-to) | 107-109 |
| Number of pages | 3 |
| Journal | Journal of Alloys and Compounds |
| Volume | 572 |
| DOIs | |
| State | Published - 25 Sep 2013 |
Keywords
- Characterization
- Microstructure
- Synthesis
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