Abstract
We analyzed the structure of buried interface of BBDMS-PPV/ITO system using a high resolution ADXPS technique. A transitional layer structure, whose chemical composition, state and valence band changed gradually from BBDMS-PPV surface of film to substrate ITO, was observed. It was found that O2- ion from ITO diffused into polymer film, interacted with back-bone carbon and formed the carbonyl bonding which could possibly constructed the channel of the carrier on the heterointerface. Indium of ITO also diffused into BBDMS-PPV layer and In(OH)3 was formed during diffusion. The diffusion and reaction between PPV/ITO interface may affect the performance of PLED significantly.
| Original language | English |
|---|---|
| Pages (from-to) | 838 |
| Number of pages | 1 |
| Journal | Gaodeng Xuexiao Huaxue Xuebao/Chemical Journal of Chinese Universities |
| Volume | 22 |
| Issue number | 5 |
| State | Published - May 2001 |
| Externally published | Yes |
Keywords
- ADXPS
- Interface analysis
- Interface structure
- PPV/ITO interface
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