Skip to main navigation Skip to search Skip to main content

Stoichiometry-engineered SiOx/KTaO3 interfaces with photoelectric coupling modulation of the transport

  • Xiangyang Wei
  • , Shuanhu Wang
  • , Jiaxin Lv
  • , Jixiang Cai
  • , Hong Yan
  • , Kexin Jin
  • Northwestern Polytechnical University Xian

Research output: Contribution to journalArticlepeer-review

Abstract

Two-dimensional electron gases at oxide interfaces offer a promising platform for future electronic devices. Here, we demonstrate photoelectric modulation of transport properties at the SiOx/KTaO3 interface. High-quality SiOx films were deposited on KTaO3 substrates by pulsed laser deposition under controlled atmospheres. XPS analysis reveals that oxygen pressure critically determines the interfacial chemical state, with oxygen vacancies modulating carrier density. Transport measurements show metallic conductivity with carrier densities of ∼1013 cm-2. Remarkably, introducing water vapor during growth significantly enhances mobility while reducing carrier density, attributed to hydroxyl-induced passivation and screening of remote Coulomb scattering. Magnetotransport studies reveal a weak antilocalization to weak localization transition accompanied by Rashba spin-orbit coupling. Furthermore, combined ultraviolet illumination and gate biasing enables reversible modulation of Rashba splitting, reaching a maximum of ∼27.18 meV. This photoelectric approach provides non-volatile control of oxide-based 2DEG spintronic properties for multifunctional quantum devices.

Original languageEnglish
Article number117539
JournalScripta Materialia
Volume286
DOIs
StatePublished - 1 Jan 2027

Keywords

  • Photoelectric coupling modulation
  • SiO/KTaO interface
  • Transport measurement
  • Two-dimensional electron gas

Fingerprint

Dive into the research topics of 'Stoichiometry-engineered SiOx/KTaO3 interfaces with photoelectric coupling modulation of the transport'. Together they form a unique fingerprint.

Cite this