Abstract
The effects of sub-bandgap illumination on the charge transport process and detector performance were experimentally studied in detector-grade CdZnTe. Based on the resulting bulk resistivity and photocurrent response under sub-bandgap illumination, the variation of the deep-level occupation fraction was identified according to a modified Shockley–Read–Hall model. From laser-beam-induced transient current measurements, a decrease of negative space-charge density and consequently flattening of the electric field distribution were found under external sub-bandgap illumination, demonstrating a reduction of the active trap concentration. Furthermore, 241Am gamma-ray spectroscopy response measurements confirmed that simultaneous incidence of sub-bandgap light could significantly improve CdZnTe detector energy resolution and charge collection efficiency.
Original language | English |
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Pages (from-to) | 3229-3235 |
Number of pages | 7 |
Journal | Journal of Electronic Materials |
Volume | 44 |
Issue number | 10 |
DOIs | |
State | Published - 5 Oct 2015 |
Keywords
- CdZnTe
- deep-level defects
- space charge
- sub-bandgap illumination